Copper Mountain News

Latest News Entries:

• CMT Vector Reflectometer in Microwave Journal

  We are proud to have an ongoing relationship with the RF and microwave community. See our ad in this month's Test and Measurement issue of Microwave Journal, which spotlights the PLANAR R54 Vector Reflectometer as well as our entire line of virtual vector network analyzers.
  
  Some of the highlights of the Test and Measurement issue: Trends in Wireless Testing, cover story on Updating Aerospace and Defense ATS, and Compact Lowpass Filters.
  
  While you're browsing through the magazine, check out the editor-selected product feature on the PLANAR R54 right here. Thanks again to Microwave Journal for taking note of our exciting new Vector Reflectometer! For more information on the PLANAR R54, see its product page or find previous press mentions it has earned.
  
  See the Microwave Journal digital version here, or click the ad below.
  

  - Posted: Tuesday, March 20, 2012

• Back from IWCE: Vector Network Analysis Wows Wireless Crowd

  Thank you to the exhibitors and attendees of the International Wireless Communications Expo for making the show in Las Vegas a success!
  
  Our most exciting product offering, the PLANAR R54 Vector Reflectometer, was a hit with RF specialists who visited our booth.
  
  The uniquely compact and accurate, PLANAR R54 opens a new chapter in cable and antenna feeder analysis. Functioning in the frequency range of 85 MHz to 5.4 GHz, PLANAR R54 has many applications in production as well as in the field. A few more details:
  
  • Uniquely small. Compact size: 117 x 39 x 19 mm; lightweight: 8 oz.
  • Accurate. Direct connectivity to any DUT (no test cable needed) reduces measurement error
  • Convenient. Powered and operated via a single USB port from any Windows PC
  • Measurement time per point: 200 µs
  • Frequency setting resolution: 10 Hz
  
  

  See our booth and products in the video on our YouTube channel here and below!
  
  
  

  Thanks again to IWCE and all who took interest in the next generation of testing we showcased at our booth. Previous media coverage of the R54 can be seen in EE Times here and in Test and Measurement World here.

  - Posted: Thursday, March 1, 2012