We guarantee all our products and parts for two years. If there are any issues with the functioning of your device, we will be happy to offer a repair or full replacement under warranty.
Copper Mountain Technologies partners with several accredited service, repair, and calibration labs across the United States and internationally. Any certified lab can perform the maintenance needed for annual verification and calibration. Please contact us for details on these procedures.
Vector network analyzers (VNAs) are widely used in research, manufacturing, and service environments. In some cases, a VNA receiver can be used for simplified spectrum analysis, which might include detection of self-excitation, determination of signal power and harmonic level, or spectrum deviation from an expected reference spectrum, among other parameters.
A large wireless provider chose the Planar 304/1 VNA to test antenna feeders and RF duplexers in the field quickly and accurately because it delivered the performance they needed at a price they could afford. The PC-driven VNA fit into a space where no other bench instrument could, communicated test data via USB, and was easily automated for future tests, resulting in higher efficiency and less potential failure of the tower's elements.
CAMD was looking to replace their aging VNA with a more modern, programmable and affordable solution. Vector network analyzers are used in storage rings to provide a diagnostic measure of the “optics” of the electron beam as it passes through magnetic lenses. Through adjustments in the ring controls, the tunes can be guided toward desirable stable points and away from resonances which would decrease the beam’s intensity. Ideally, a portable VNA was desired so that it could be also used in maintenance and testing applications around the facility. The Planar TR1300/1 VNA was more affordable than a looming CRT replacement for CAMD’s legacy analyzer, which has been idle since the TR1300/1 arrived.
R&D Microwaves was looking to equip their test bench with a VNA for tuning bandpass filters in a prototyping and production environment. These tasks included straight tuning of low frequency VHF diplexers and measuring group delay and return loss. The Planar 304/1 VNA improved workflow, saving time and money in the process.
PC-driven VNAs increase productivity and lower costs for test, quality control, and design applications, capitalizing on the ever-increasing performance of personal computers. Engineers using this format can downsize their equipment and experience significant productivity gains at a fraction of the cost of traditional analyzers.
Application of the unscented transformation (UT) and higher order unscented transformation (HOUT) are considered for uncertainty analysis. Using the principle that a set of discretely sampled points can be used to calculate mean and covariance, we can analyze nonlinear systems without the linearization steps and without defining the Jacobian matrix. (Presented at the 82nd Annual IEEE ARFTG Conference)
A method is introduced for determination of a VNA’s calibration residual errors for measurement of the reflection coefficient. The proposed method shows particular advantages when the use of a long verification line is impractical (e.g. at the wafer-level), or for measurements at low frequency ranges or similar cases when the resolution of conventional time domain methods is low. Experimental studies were conducted for two frequency ranges and in coaxial and on-wafer measurement environment. The proposed algorithm is a useful for a wide range of practical applications especially for measuring uncertainty estimation of cost-effective vector network analyzers. (Presented at the 82nd Annual IEEE ARFTG Conference)
Implications of OFDM for some of the most popular digital performance test metrics, such as modulation-error ratio (MER), bit-error ratio (BER), constellation, and equalization, then offer some approaches for test and measurement of OFDM based on past experience and future possibilities.