We guarantee all our products and parts for two years. If there are any issues with the functioning of your device, we will be happy to offer a repair or full replacement under warranty.
Copper Mountain Technologies partners with several accredited service, repair, and calibration labs across the United States and internationally. Any certified lab can perform the maintenance needed for annual verification and calibration. Please contact us for details on these procedures.
Antenna pattern measurement is a critical step in the design process of antennas and wireless devices. Compact antenna measurement systems combined with a high performance VNA are necessary to characterize parameters such as pattern, gain, VSWR, and efficiency. By using an in-house measurement system, multiple design revisions can be tested and pre-certified without the high cost of using an accredited or certified measurement facility for each test. Portability and low cost are particularly important to engineers in various environments like defense and education, respectively. See how these challenges are addressed with the DAMS Antenna Measurement System and the Planar 804/1 VNA.
This article describes the advantages of VNA calibration by the Unknown Thru (SOLR) method, compared to traditional SOLT calibration for measurement of 2-port non-insertable devices. Errors which surface during SOLT calibration are demonstrated, and recommendations are given for assessing the quality of the conducted SOLR calibration
Vector network analyzers (VNAs) are widely used in research, manufacturing, and service environments. In some cases, a VNA receiver can be used for simplified spectrum analysis, which might include detection of self-excitation, determination of signal power and harmonic level, or spectrum deviation from an expected reference spectrum, among other parameters.
A large wireless provider chose the Planar 304/1 VNA to test antenna feeders and RF duplexers in the field quickly and accurately because it delivered the performance they needed at a price they could afford. The PC-driven VNA fit into a space where no other bench instrument could, communicated test data via USB, and was easily automated for future tests, resulting in higher efficiency and less potential failure of the tower's elements.
Over at EDN, Steve Sandler profiles the application of an S5048 VNA in measuring PDN. Useful features include log frequency sweep and 1-port and 2-port time domain functions (TDR/TDT). It is suggested to use the combination of the OMICRON Lab Bode 100 and the S5048 to provide a cost-effective solution for measurements of PDN up to 4.8 GHz.
VNAs can be used to measure 75 Ohm coaxial transmission lines. In this article, we will discuss making these measurements using a VNA with 50 Ohm test ports, in conjunction with 50 to 75 Ohm Minimum Loss Pads (MLP), i.e. impedance matching attenuators with insertion loss of 5.7 dB. The use of an MLP affects the accuracy of measurements by changing the calibration error and, depending on the location of the attenuator in the measurement circuit, impacts stability of measurements related to test cable bending. To assess the impact of MLP on the accuracy of the measurements, we will compare this calibration method with typical errors of VNAs with 75 Ohm coaxial lines after performing SOLT calibration.
VNAs may be useful in performing voltage or current measurements of active DUTs, with the VNA generator sweeping over frequency or power. This application note shows how to make highly accurate and quick synchronous voltage or current measurements by adding a simple program and an affordable, general purpose DMM.
VNA users often need to estimate, and strive to optimize, their instrument’s measurement speed. Many RF Engineers are interested in the trade offs between speed, accuracy and resolution, especially those striving to achieve optimal automation of the instrument in the context of a integrated in a larger measurement system or production environment. This application note details the determining factors for measurement cycle time in a Copper Mountain Technologies VNA.
CAMD was looking to replace their aging VNA with a more modern, programmable and affordable solution. Vector network analyzers are used in storage rings to provide a diagnostic measure of the “optics” of the electron beam as it passes through magnetic lenses. Through adjustments in the ring controls, the tunes can be guided toward desirable stable points and away from resonances which would decrease the beam’s intensity. Ideally, a portable VNA was desired so that it could be also used in maintenance and testing applications around the facility. The Planar TR1300/1 VNA was more affordable than a looming CRT replacement for CAMD’s legacy analyzer, which has been idle since the TR1300/1 arrived.
R&D Microwaves was looking to equip their test bench with a VNA for tuning bandpass filters in a prototyping and production environment. These tasks included straight tuning of low frequency VHF diplexers and measuring group delay and return loss. The Planar 304/1 VNA improved workflow, saving time and money in the process.
PC-driven VNAs increase productivity and lower costs for test, quality control, and design applications, capitalizing on the ever-increasing performance of personal computers. Engineers using this format can downsize their equipment and experience significant productivity gains at a fraction of the cost of traditional analyzers.
This video presents a new method for verification of the residual errors of calibrated two-port vector network analyzers based on a special time-domain technique. The method requires two devices under test including a high-precision air line. Calibration residual errors are extracted from a distance frequency system model and special estimation algorithm based on the quasi-optimal unscented Kalman filter. Experimental studies were conducted in coaxial measurement environments and at the wafer level. Suitable applications of the proposed verification method are discussed.
Application of the unscented transformation (UT) and higher order unscented transformation (HOUT) are considered for uncertainty analysis. Using the principle that a set of discretely sampled points can be used to calculate mean and covariance, we can analyze nonlinear systems without the linearization steps and without defining the Jacobian matrix. (Presented at the 82nd Annual IEEE ARFTG Conference)
A method is introduced for determination of a VNA’s calibration residual errors for measurement of the reflection coefficient. The proposed method shows particular advantages when the use of a long verification line is impractical (e.g. at the wafer-level), or for measurements at low frequency ranges or similar cases when the resolution of conventional time domain methods is low. Experimental studies were conducted for two frequency ranges and in coaxial and on-wafer measurement environment. The proposed algorithm is a useful for a wide range of practical applications especially for measuring uncertainty estimation of cost-effective vector network analyzers. (Presented at the 82nd Annual IEEE ARFTG Conference)
Implications of OFDM for some of the most popular digital performance test metrics, such as modulation-error ratio (MER), bit-error ratio (BER), constellation, and equalization, then offer some approaches for test and measurement of OFDM based on past experience and future possibilities.