Copper Mountain Technologies Press Presence


CMT Managing Director Alex Goloschokin in Microwaves & RF

Microwaves & RF's October issue features our Managing Director, Alex Goloschokin, as interviewed by Editor-in-Chief Nancy Friedrich. Alex discusses the origins of Copper Mountain Technologies, the technology behind Virtual Vector Network Analyzers, and future product line expansion.
See the full interview here!
Go to original Inside Track interview

Microwave Product Digest

Thanks to Microwave Product Digest online for featuring us in their new products section! See the editorial coverage in MPD here!

Microwave Journal

Copper Mountain Technologies is in the press again with editorial coverage of our exciting debut device, the PLANAR R54 Vector Reflectometer. In the same issue, see our ad in this month's Test and Measurement issue of Microwave Journal, which spotlights the PLANAR R54 as well as our entire line of virtual vector network analyzers. Some of the issue's highlights include: Trends in Wireless Testing, cover story on Updating Aerospace and Defense ATS, and Compact Lowpass Filters.

Check out the editor-selected product feature on the PLANAR R54 right here. Thanks again to Microwave Journal for taking note of our exciting new R54 Vector Reflectometer! For more information on the PLANAR R54, see its product page or find previous press mentions it has earned.

See the Microwave Journal digital version here, or click the ad below.

PLANAR R54 Vector Reflectometer in Microwave Journal

Test and Measurement World


Watch and rate our front page feature in Test and Measurement World, the leading source for market news, industry trends and applications for engineers involved in electronic instrument testing and measurement! Copper Mountain Technologies' Managing Director Alex Goloschokin is interviewed about our newest vector network analyzer, the portable PLANAR R54. Watch the video about our virtual, portable, lab quality PLANAR R54 here.

Thanks to TM World for making us your front page feature. See the video now!
This interview also appears in EE Times here.
Test and Measurement World Front Page Feature of New Vector Network Analyzer R54

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